The Denver X-ray Conference
DXC 2008
- Plenary Session "Stress Analysis"
4 - 8 August 2008
Denver Marriott Tech Center Hotel
Denver, Colorado
Joint meeting with the Eight International Conference on Residual Stresses
For an overview of things to see and do in Denver, please visit this site: www.denver.org
History
In 1951, the University of Denver held perhaps the world’s first one-day symposium on the application of X-rays to the study of materials and the importance of X-rays in research. From this humble beginning, the Annual Conference on Applications of X-ray Analysis, as it was known, grew and continues to flourish as the world’s leading forum for scientists working in the field of X-ray materials analysis. The Denver X-ray Conference (DXC) still provides a unique mixture of sessions on training, education, and applications and papers containing details about state-of-the-art techniques and future developments in X-ray analysis. Another important part of the meeting is the presence of leading manufacturers of X-ray equipment who exhibit their most recent equipment and have their technical people available to offer their suggestions on how one might use their equipment to solve problems.
The organization and sponsorship of the conference remained with the University of Denver until 1997. Beginning in 1998, the International Centre for Diffraction Data (ICDD), a long-time contributor to the DXC, assumed ownership of the conference from the University of Denver.
The technical program of the DXC is created and monitored by the Denver X-ray Conference Organizing Committee (DXCOC). The Committee consists of specialists from various fields of X-ray analysis, each of whom contributes his or her expertise to the technical program. The DXCOC meets annually to prepare the technical program, regulate the guidelines for sessions and workshops, and establish future goals of the conference. The Committee also dedicates itself to ensuring the integrity of the meeting. While exhibits have become a large attraction, the DXCOC maintains a commercial-free, vendor-neutral technical program.
Working in partnership with the DXCOC, ICDD manages the financial aspects of the conference and its administration, including the exhibition of X-ray products and services, registration, hotel negotiations, the web site, and publication of the conference proceedings, Advances in X-ray Analysis. Together, the DXCOC and ICDD work to carry on the original goal of the Denver X-ray Conference, and to continue its esteemed tradition of excellence.
Pictured below are members of the 2008 DXCOC and the ICDD staff:
Front Row: (left to right): John Anzelmo, Bob Snyder, Victor Buhrke, John Gilfrich, René Van Grieken, Cev Noyan, Mary Ann Zaitz
Back Row: George Havrilla, Tom Blanton, Brian Toby, Tim Elam, Denise Flaherty, Terry Maguire, Scott Misture,
(not pictured: Ting Huang, Randy Barton, Jim Kaduk)
2008 Denver X-ray Conference Organizing Committee
-Robert L. Snyder, Chairman, Georgia Institute of Technology, Atlanta, GA
-W. Tim Elam, Co-chairman, EDAX, Inc., Mahwah, NJ and University of Washington, Redmond, WA
-John Anzelmo, Anzelmo & Associates, Inc., Madison, WI
-Randolph Barton, Jr., Emeritus, DuPont Experimental Station, Wilmington, DE
-Thomas Blanton, Eastman Kodak Company Research Labs, Rochester, NY
-Victor E. Buhrke, Past Chair, Consultant, Portola Valley, CA
-Denise Flaherty , International Centre for Diffraction Data, Newtown Square, PA
-John V. Gilfrich, Emeritus, SFA, Inc./NRL, Bethesda, MD
-George Havrilla, Los Alamos National Laboratory, Los Alamos, NM
-Ting C. Huang, Emeritus, IBM Almaden Research Center, San Jose, CA
-James A. Kaduk, INEOS Technologies, Naperville, IL
-Terry Maguire, International Centre for Diffraction Data, Newtown Square, PA
-Scott Misture, NYS College of Ceramics at Alfred University, Alfred, NY
-I. Cev Noyan, Columbia University, New York, NY
-Brian Toby, APS—Argonne National Laboratory, Argonne, IL
-René Van Grieken, University of Antwerp, Antwerp, Belgium
-Mary Ann Zaitz, IBM, Hopewell Junction, NY
Advances in X-ray Analysis
Volume 49, Advances in X-ray Analysis, proceedings of the 2005 Denver X-ray Conference, is now available on CD-ROM.
Advances in X-ray Analysis - proceedings of the 2005 Denver X-ray Conference and previous years are available on CD-ROM and through the ICDD website.
Have an idea for a workshop or session? - Submit your suggestion to the Denver X-ray Conference Organizing Committee for consideration.
Authors - Please remember to read the updated Preparation of Manuscripts for Electronic Publication Page for Advances in X-ray Analysis
Denver X-ray Conference Awards - learn how to earn the Jenkins, Barrett, Birks, and Jerome B. Cohen awards